
Sawing Temperature in SiC Wafer Cutting: A Diamond Wire Saw Control Guide
Temperature is easy to treat as a secondary variable in SiC wafer cutting. A machine may report stable wire speed, the coolant tank may remain
Diamond Wire Cutting Systems for Electronic Ceramic Substrate Manufacturing & Dicing
Electronic ceramic substrates are used in a wide variety of semiconductor and electronic manufacturing processes. Without sufficient precision cutting, the dimensional errors and material damage generated during substrate processing can lead to reduced device performance, increased yield loss and consequential failure of the end product. To ensure optimum functionality of multi-layer ceramic components, power modules and electronic packages at all times and to minimize production downtime, reliable, high-precision substrate processing must be ensured.
In addition to ultra-tight dimensional accuracy to meet the packaging requirements, the diamond wire cutting systems used should meet other requirements. Among other things, semiconductor industry quality standards must be complied with, which means that the cutting systems must have very low kerf loss and minimal sub-surface damage. Furthermore, there are high requirements for process stability, for example when used in high-volume production lines, so the systems must be designed so that there is consistent, repeatable cutting performance. In addition, a compact footprint is of great importance when integrated into automated substrate manufacturing lines with limited factory space.
With the Electronic Ceramic Substrate Processing Line, ewirexon supplies some of the world’s most high-precision and at the same time most cost-effective diamond wire cutting systems for electronic ceramic substrate manufacturing. Specially developed for slicing alumina, aluminum nitride (AlN) and multi-layer ceramic substrates, the cutting systems deliver ultra-tight dimensional accuracy with a very compact and robust design. Thus, the systems enable a space-saving production line design even at high throughput and variable processing parameters. Thanks to the low kerf loss of the cutting systems, material yield can be maximized depending on the substrate type.
| N.º. | Parámetro | Especificaciones |
| 1 | Modelo | TCQF400LNC-FM-HL |
| 2 | Principio de corte | Alambre de diamante sin fin / Corte físico |
| 3 | Funciones de corte | Corte en rodajas / Corte en ángulo y de perfiles |
| 4 | Tamaño máximo de la pieza de trabajo (mm) | Φ600 mm, altura 500 mm |
| 5 | Dimensiones de la mesa de trabajo (mm) | Plataforma giratoria de Ø380 |
| 6 | Precisión de planitud del corte (mm) | 0.08 |
| 7 | Rugosidad superficial (μm) | Ra 0,8 μm |
| 8 | Especificaciones del alambre (mm) | Ø 0,65–1,0/2580 |
| 9 | Sistema de tensión | Control de tensión constante del cable |
| 10 | Cantidad de ruedas guía | 4 ruedas |
| 11 | Motor de accionamiento | Servomotor |
| 12 | Velocidad del alambre (m/s) | 51Max (ajustable) |
| 13 | Potencia total (kW) | 2.8 |
| 14 | Tensión | 220 V, 50 Hz |
| 15 | Sistema de control | Sistema Tongcheng T32 desarrollado a medida |
| 16 | Dimensiones (L × An × Al) (mm) | 1350 × 1066 × 1968 |
| 17 | Peso bruto (kg) | 720 |

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